I
- inclusive metrics
- defined,
Function-Level Metrics: Exclusive, Inclusive, and Attributed
- effect of recursion on,
How Recursion Affects Function-Level Metrics
- for outlined functions,
Inclusive Metrics
- for PLT instructions,
Function Calls Between Shared Objects
- how computed,
Call Stacks and Program Execution
- illustrated,
Interpreting Attributed Metrics: An Example
- use of,
Function-Level Metrics: Exclusive, Inclusive, and Attributed
- index lines,
Index Lines in the Source Tab
- in Disassembly tab
Data Tabs in Left Pane
Annotated Disassembly Code
- in er_print utility
source|src { filename | function_name } [ N]
source|src { filename | function_name } [ N]
- in Source tab
Data Tabs in Left Pane
Index Lines in the Source Tab
Annotated Disassembly Code
- index lines, special
- compiler-generated body functions,
Compiler-Generated Body Functions
- HotSpot-compiled instructions,
Dynamically Compiled Functions
- instructions without line numbers,
Dynamically Compiled Functions
- Java native methods,
Java Native Functions
- outline functions,
Outline Functions
- index-object metrics, displaying list of in er_print utility,
indx_metric_list
- index objects,
indxobj indxobj_type
- defining,
indxobj_define indxobj_type index_exp
- listing,
indxobj_list
- Index Objects Tabs,
Data Tabs in Left Pane
- indxobj command,
indxobj indxobj_type
- indxobj_define command,
indxobj_define indxobj_type index_exp
- indxobj_list command,
indxobj_list
- inlined functions,
Inlined Functions
- input file
- terminating in er_print utility,
quit
- to er_print utility,
script file
- Inst–Freq tab,
Data Tabs in Left Pane
- instruction frequency, printing list in er_print utility,
ifreq
- instruction issue
- delay,
Instruction Issue Delay
- grouping, effect on annotated disassembly,
Instruction Issue Grouping
- intermediate files, use for annotated source listings,
Intermediate Files
- interposition by Collector on system library functions,
Using System Libraries
- interval, profiling, See profiling interval
- interval, sampling, See sampling interval